Goldstein,joseph <br/><br/>
Scanning Electron Microscopy and X-Ray Microanalysis 

 - New York,  Springer New York, NY  2018 
 - XXIII, 550 
<br/><br/><label>ISBN: </label>9781493982691 
<br/><br/><label>Subjects--Topical Terms: </label><br/>EBSD Electron backscatter diffraction Environmental SEM Focused ion beam Ion beam microanalysis Qualitative X-ray analysis Quantitative X-ray analysis SDD x-ray detectors SEM textbook Table top SEM Variable pressure SEM X-ray mapping X-ray microanalysis book X-ray spectral measurement dual column instruments Biological Microscopy
<br/><br/><label>Dewey Class. No.: </label>502.825 23  / GOLS.