00807nam a22001937a 4500 36347 Ost 20260507154549.0 251113s9999||||xx |||||||||||||| ||eng|| 9781493982691 nitttr 502.825 23 GOLS. Goldstein,joseph Scanning Electron Microscopy and X-Ray Microanalysis New York, Springer New York, NY 2018 XXIII, 550 EBSD Electron backscatter diffraction Environmental SEM Focused ion beam Ion beam microanalysis Qualitative X-ray analysis Quantitative X-ray analysis SDD x-ray detectors SEM textbook Table top SEM Variable pressure SEM X-ray mapping X-ray microanalysis book X-ray spectral measurement dual column instruments Biological Microscopy BK 156 156 0 0 0 0 NITTTR NITTTR 2026-05-07 0 502.825 23 GOLS. 50266 2026-05-07 15:45:49 2026-05-07 BK