Goldstein,joseph creator text xx New York Springer New York, NY 2018 9999 monographic eng XXIII, 550 EBSD Electron backscatter diffraction Environmental SEM Focused ion beam Ion beam microanalysis Qualitative X-ray analysis Quantitative X-ray analysis SDD x-ray detectors SEM textbook Table top SEM Variable pressure SEM X-ray mapping X-ray microanalysis book X-ray spectral measurement dual column instruments Biological Microscopy 502.825 23 GOLS. 9781493982691 251113 20260507154549.0 36347