TY  - BOOK
AU  -  Goldstein,joseph
TI  - Scanning Electron Microscopy and X-Ray Microanalysis
SN  - 9781493982691
U1  - 502.825 23 
PY  - 2018///
CY  -  New York
PB  - Springer New York, NY
KW  - EBSD Electron backscatter diffraction Environmental SEM Focused ion beam Ion beam microanalysis Qualitative X-ray analysis Quantitative X-ray analysis SDD x-ray detectors SEM textbook Table top SEM Variable pressure SEM X-ray mapping X-ray microanalysis book X-ray spectral measurement dual column instruments Biological Microscopy
ER  -