Goldstein,joseph  joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy <br/><br/>
Scanning Electron Microscopy and X-Ray Microanalysis 

 - New York,  Springer New York, NY  2018 
 - XXIII, 550  137 b/w illustrations, 409 illustrations in colour 
<br/><br/><label>ISBN: </label>978-1-4939-8269-1  
<br/><br/><label>Subjects--Topical Terms: </label><br/>EBSD Electron backscatter diffraction Environmental SEM Focused ion beam Ion beam microanalysis Qualitative X-ray analysis Quantitative X-ray analysis SDD x-ray detectors SEM textbook Table top SEM Variable pressure SEM X-ray mapping X-ray microanalysis book X-ray spectral measurement dual column instruments Biological Microscopy
<br/><br/><label>Dewey Class. No.: </label>502.825 23 GOLS.