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| 001 | 10281 | ||
| 003 | IN-NITTTR | ||
| 005 | 20251114233056.0 | ||
| 008 | 251113s9999||||xx |||||||||||||| ||eng|| | ||
| 040 | _beng | ||
| 040 | _cIN-NITTTR | ||
| 041 | _aeng | ||
| 082 | _a621.38137 S58T | ||
| 100 | _aSimpson, A. | ||
| 245 | 0 |
_aTesting methods and reliability-electronics. / _cSimpson, A. |
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| 942 |
_2ddc _cBK |
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_c12918 _d12918 |
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