000			00807nam a22001937a 4500
001			36347
003			Ost
005			20260507154549.0
008			251113s9999||||xx |||||||||||||| ||eng||
020			_a9781493982691
040			_cnitttr
082			_a502.825 23 _bGOLS.
100			_a Goldstein,joseph
245		0	_aScanning Electron Microscopy and X-Ray Microanalysis
260			_a New York, _bSpringer New York, NY _c2018
300			_aXXIII, 550
650			_aEBSD Electron backscatter diffraction Environmental SEM Focused ion beam Ion beam microanalysis Qualitative X-ray analysis Quantitative X-ray analysis SDD x-ray detectors SEM textbook Table top SEM Variable pressure SEM X-ray mapping X-ray microanalysis book X-ray spectral measurement dual column instruments Biological Microscopy
942			_cBK
999			_c156 _d156