| 000 | 00986nam a22001817a 4500 | ||
|---|---|---|---|
| 003 | NITTTR | ||
| 005 | 20260202113618.0 | ||
| 008 | 260202b |||||||| |||| 00| 0 eng d | ||
| 020 | _a978-1-4939-8269-1 | ||
| 040 |
_beng _cnitttr |
||
| 082 |
_24th _a502.825 23 GOLS. |
||
| 100 |
_a Goldstein,joseph _djoseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy |
||
| 245 | _aScanning Electron Microscopy and X-Ray Microanalysis | ||
| 260 |
_a New York, _bSpringer New York, NY _c2018 |
||
| 300 |
_aXXIII, 550 _b137 b/w illustrations, 409 illustrations in colour |
||
| 650 | _aEBSD Electron backscatter diffraction Environmental SEM Focused ion beam Ion beam microanalysis Qualitative X-ray analysis Quantitative X-ray analysis SDD x-ray detectors SEM textbook Table top SEM Variable pressure SEM X-ray mapping X-ray microanalysis book X-ray spectral measurement dual column instruments Biological Microscopy | ||
| 942 |
_2ddc _cBK _n0 |
||
| 999 |
_c35771 _d35771 |
||