Scanning Electron Microscopy and X-Ray Microanalysis
Goldstein,joseph
Scanning Electron Microscopy and X-Ray Microanalysis - New York, Springer New York, NY 2018 - XXIII, 550
9781493982691
EBSD Electron backscatter diffraction Environmental SEM Focused ion beam Ion beam microanalysis Qualitative X-ray analysis Quantitative X-ray analysis SDD x-ray detectors SEM textbook Table top SEM Variable pressure SEM X-ray mapping X-ray microanalysis book X-ray spectral measurement dual column instruments Biological Microscopy
502.825 23 / GOLS.
Scanning Electron Microscopy and X-Ray Microanalysis - New York, Springer New York, NY 2018 - XXIII, 550
9781493982691
EBSD Electron backscatter diffraction Environmental SEM Focused ion beam Ion beam microanalysis Qualitative X-ray analysis Quantitative X-ray analysis SDD x-ray detectors SEM textbook Table top SEM Variable pressure SEM X-ray mapping X-ray microanalysis book X-ray spectral measurement dual column instruments Biological Microscopy
502.825 23 / GOLS.