Scanning Electron Microscopy and X-Ray Microanalysis (Record no. 156)

MARC details
000 -LEADER
fixed length control field 00807nam a22001937a 4500
001 - CONTROL NUMBER
control field 36347
003 - CONTROL NUMBER IDENTIFIER
control field Ost
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20260507154549.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 251113s9999||||xx |||||||||||||| ||eng||
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781493982691
040 ## - CATALOGING SOURCE
Transcribing agency nitttr
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 502.825 23
Item number GOLS.
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Goldstein,joseph
245 #0 - TITLE STATEMENT
Title Scanning Electron Microscopy and X-Ray Microanalysis
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. New York,
Name of publisher, distributor, etc. Springer New York, NY
Date of publication, distribution, etc. 2018
300 ## - PHYSICAL DESCRIPTION
Extent XXIII, 550
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element EBSD Electron backscatter diffraction Environmental SEM Focused ion beam Ion beam microanalysis Qualitative X-ray analysis Quantitative X-ray analysis SDD x-ray detectors SEM textbook Table top SEM Variable pressure SEM X-ray mapping X-ray microanalysis book X-ray spectral measurement dual column instruments Biological Microscopy
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Total checkouts Full call number Barcode Date last seen Price effective from Koha item type
        National Institute of Technical Teachers Training & Research National Institute of Technical Teachers Training & Research 05/07/2026   502.825 23 GOLS. 50266 05/07/2026 05/07/2026 Books